Interconnect technology in high bandwidth memory (HBM) is at a fork in the road, with two possible directions: microbump technology and hybrid bonding.
Both technologies are evolving to address the requirements of next-generation HBM, including increased I/O density, higher bandwidth, and improved performance.
As data rates rise, there is a need for increased output contact pad density, which is being addressed by pushing bump technologies beyond their physical and performance limits.
According to the authors,
some memory designers are innovating their way to bump sizes far below 10µm in high volume manufacturing.
Authors: Damon Tsai, Woo Young Han, and Tim Kryman.
Summary: Innovations in interconnect technology for high bandwidth memory.